%0 Conference Paper %1 conf/vts/PengBSWT11 %A Peng, Ke %A Bao, Fang %A Shofner, Geoff %A Winemberg, LeRoy %A Tehranipoor, Mohammad %B VTS %D 2011 %I IEEE Computer Society %K dblp %P 78-83 %T Case Study: Efficient SDD test generation for very large integrated circuits. %U http://dblp.uni-trier.de/db/conf/vts/vts2011.html#PengBSWT11 %@ 978-1-61284-657-6

@inproceedings{conf/vts/PengBSWT11, added-at = {2011-06-03T00:00:00.000+0200}, author = {Peng, Ke and Bao, Fang and Shofner, Geoff and Winemberg, LeRoy and Tehranipoor, Mohammad}, biburl = {https://www.bibsonomy.org/bibtex/20643ee787298deeede125241ae01df77/dblp}, booktitle = {VTS}, crossref = {conf/vts/2011}, ee = {http://dx.doi.org/10.1109/VTS.2011.5783759}, interhash = {644016e93eee62677cda3ff9aa81b33a}, intrahash = {0643ee787298deeede125241ae01df77}, isbn = {978-1-61284-657-6}, keywords = {dblp}, pages = {78-83}, publisher = {IEEE Computer Society}, timestamp = {2015-06-18T22:51:32.000+0200}, title = {Case Study: Efficient SDD test generation for very large integrated circuits.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2011.html#PengBSWT11}, year = 2011 }