%0 Journal Article %1 journals/jim/KimLAL20 %A Kim, Myeongso %A Lee, Minyoung %A An, Minjeong %A Lee, Hongchul %D 2020 %J J. Intell. Manuf. %K dblp %N 5 %P 1165-1174 %T Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel. %U http://dblp.uni-trier.de/db/journals/jim/jim31.html#KimLAL20 %V 31

@article{journals/jim/KimLAL20, added-at = {2020-10-26T00:00:00.000+0100}, author = {Kim, Myeongso and Lee, Minyoung and An, Minjeong and Lee, Hongchul}, biburl = {https://www.bibsonomy.org/bibtex/2019e58658601e742ab854b01d0a95ffb/dblp}, ee = {https://doi.org/10.1007/s10845-019-01502-y}, interhash = {65c9247d16b6c4b0f78c55a3ce2fa484}, intrahash = {019e58658601e742ab854b01d0a95ffb}, journal = {J. Intell. Manuf.}, keywords = {dblp}, number = 5, pages = {1165-1174}, timestamp = {2020-10-27T12:20:13.000+0100}, title = {Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel.}, url = {http://dblp.uni-trier.de/db/journals/jim/jim31.html#KimLAL20}, volume = 31, year = 2020 }