Аннотация
Surface studies of ionic liquids are particularly important for all
kinds of multiphasic operations employing ionic liquids, e.g. biphasic
homogeneous catalysis or supported ionic liquid phase catalysis. Using
X-ray photoelectron spectroscopy (XPS), the surface composition of the
model system 1-ethyl-3-methylimidazolium ethylsulfate
EMIMEtOSO3 was investigated. By comparing two different samples
of this ionic liquid from two different origins, we observed a decisive
influence of silicon containing impurities on composition and structure
of the surface. For the case of the impurities containing ionic liquid,
our angle-dependent XPS data are in agreement with a model of a surface
layer consisting of highly oriented ionic liquid molecules. From a
fundamental point of view, our study may be of general relevance for
the understanding, of the chemistry of liquid surfaces in general.
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