Inproceedings,
Robustness to Device Degradation in Silicon FeFET-based Reservoir Computing (Invited).
K. Toprasertpong, E. Nako, S. Min, Z. Cai, S. Cho, R. Suzuki, R. Nakane, M. Takenaka, and S. Takagi.IRPS, page 1-6. IEEE, (2024)
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- conf/irps/ToprasertpongNMCCSNTT24
- entry type
- inproceedings
- booktitle
- IRPS
- year
- 2024
- pages
- 1-6
- publisher
- IEEE
- crossref
- conf/irps/2024
- ee
- https://doi.org/10.1109/IRPS48228.2024.10529344
- isbn
- 979-8-3503-6976-2
- url
- http://dblp.uni-trier.de/db/conf/irps/irps2024.html#ToprasertpongNMCCSNTT24
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- please select -%0 Conference Paper
%1 conf/irps/ToprasertpongNMCCSNTT24
%A Toprasertpong, Kasidit
%A Nako, Eishin
%A Min, Shin-Yi
%A Cai, Zuocheng
%A Cho, Seong-Kun
%A Suzuki, Rikuo
%A Nakane, Ryosho
%A Takenaka, Mitsuru
%A Takagi, Shinichi
%B IRPS
%D 2024
%I IEEE
%K dblp
%P 1-6
%T Robustness to Device Degradation in Silicon FeFET-based Reservoir Computing (Invited).
%U http://dblp.uni-trier.de/db/conf/irps/irps2024.html#ToprasertpongNMCCSNTT24
%@ 979-8-3503-6976-2
@inproceedings{conf/irps/ToprasertpongNMCCSNTT24,
added-at = {2024-05-29T00:00:00.000+0200},
author = {Toprasertpong, Kasidit and Nako, Eishin and Min, Shin-Yi and Cai, Zuocheng and Cho, Seong-Kun and Suzuki, Rikuo and Nakane, Ryosho and Takenaka, Mitsuru and Takagi, Shinichi},
biburl = {https://www.bibsonomy.org/bibtex/262db4353060df959626d7d5398c96854/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2024},
ee = {https://doi.org/10.1109/IRPS48228.2024.10529344},
interhash = {6864677407e766a7f3efb3cfec700e60},
intrahash = {62db4353060df959626d7d5398c96854},
isbn = {979-8-3503-6976-2},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2024-06-03T07:16:33.000+0200},
title = {Robustness to Device Degradation in Silicon FeFET-based Reservoir Computing (Invited).},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2024.html#ToprasertpongNMCCSNTT24},
year = 2024
}