%0 Conference Paper %1 conf/itc/BoschiSGKH20 %A Boschi, Gabriele %A Spano, Elisa %A Grigoryan, Hayk T. %A Kumar, Arun %A Harutyunyan, Gurgen %B ITC %D 2020 %I IEEE %K dblp %P 1-6 %T Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications. %U http://dblp.uni-trier.de/db/conf/itc/itc2020.html#BoschiSGKH20 %@ 978-1-7281-9113-3

@inproceedings{conf/itc/BoschiSGKH20, added-at = {2021-01-25T00:00:00.000+0100}, author = {Boschi, Gabriele and Spano, Elisa and Grigoryan, Hayk T. and Kumar, Arun and Harutyunyan, Gurgen}, biburl = {https://www.bibsonomy.org/bibtex/2c8d8d85b5f7fd5ba8d8b68c8c30d8649/dblp}, booktitle = {ITC}, crossref = {conf/itc/2020}, ee = {https://doi.org/10.1109/ITC44778.2020.9325242}, interhash = {6913409ee4c1f730dcaa7c29a6a3bb8e}, intrahash = {c8d8d85b5f7fd5ba8d8b68c8c30d8649}, isbn = {978-1-7281-9113-3}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-10T00:23:05.000+0200}, title = {Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2020.html#BoschiSGKH20}, year = 2020 }