%0 Journal Article %1 journals/mr/ReigosaIRB17 %A Reigosa, Paula Diaz %A Iannuzzo, Francesco %A Rahimo, Munaf %A Blaabjerg, Frede %D 2017 %J Microelectron. Reliab. %K dblp %P 485-489 %T Capacitive effects in IGBTs limiting their reliability under short circuit. %U http://dblp.uni-trier.de/db/journals/mr/mr76.html#ReigosaIRB17 %V 76-77

@article{journals/mr/ReigosaIRB17, added-at = {2022-10-02T00:00:00.000+0200}, author = {Reigosa, Paula Diaz and Iannuzzo, Francesco and Rahimo, Munaf and Blaabjerg, Frede}, biburl = {https://www.bibsonomy.org/bibtex/267bf320a034837a8c2b20f40f1231307/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.07.059}, interhash = {692cbdb1ddc740a7d7f34ac53ef0e897}, intrahash = {67bf320a034837a8c2b20f40f1231307}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {485-489}, timestamp = {2024-04-09T02:48:37.000+0200}, title = {Capacitive effects in IGBTs limiting their reliability under short circuit.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr76.html#ReigosaIRB17}, volume = {76-77}, year = 2017 }