%0 Conference Paper %1 conf/sbcci/ArgyridesDPLC09 %A Argyrides, Costas %A Dimosthenous, Giorgos %A Pradhan, Dhiraj K. %A Lisbôa, Carlos Arthur Lang %A Carro, Luigi %B SBCCI %D 2009 %E Silva, Ivan Saraiva %E Ribas, Renato P. %E Plett, Calvin %I ACM %K dblp %T Reliability aware yield improvement technique for nanotechnology based circuits. %U http://dblp.uni-trier.de/db/conf/sbcci/sbcci2009.html#ArgyridesDPLC09 %@ 978-1-60558-705-9

@inproceedings{conf/sbcci/ArgyridesDPLC09, added-at = {2018-11-06T00:00:00.000+0100}, author = {Argyrides, Costas and Dimosthenous, Giorgos and Pradhan, Dhiraj K. and Lisbôa, Carlos Arthur Lang and Carro, Luigi}, biburl = {https://www.bibsonomy.org/bibtex/22085efb950da0aa97493f117d9cecb24/dblp}, booktitle = {SBCCI}, crossref = {conf/sbcci/2009}, editor = {Silva, Ivan Saraiva and Ribas, Renato P. and Plett, Calvin}, ee = {https://doi.org/10.1145/1601896.1601958}, interhash = {69bdb38014692bc2ad22d28369053055}, intrahash = {2085efb950da0aa97493f117d9cecb24}, isbn = {978-1-60558-705-9}, keywords = {dblp}, publisher = {ACM}, timestamp = {2018-11-20T11:39:10.000+0100}, title = {Reliability aware yield improvement technique for nanotechnology based circuits.}, url = {http://dblp.uni-trier.de/db/conf/sbcci/sbcci2009.html#ArgyridesDPLC09}, year = 2009 }