%0 Conference Paper %1 conf/dft/YotsuyanagiHIIT01 %A Yotsuyanagi, Hiroyuki %A Hashizume, Masaki %A Iwakiri, Taisuke %A Ichimiya, Masahiro %A Tamesada, Takeomi %B DFT %D 2001 %I IEEE Computer Society %K dblp %P 287- %T Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. %U http://dblp.uni-trier.de/db/conf/dft/dft2001.html#YotsuyanagiHIIT01 %@ 0-7695-1203-8

@inproceedings{conf/dft/YotsuyanagiHIIT01, added-at = {2023-03-24T00:00:00.000+0100}, author = {Yotsuyanagi, Hiroyuki and Hashizume, Masaki and Iwakiri, Taisuke and Ichimiya, Masahiro and Tamesada, Takeomi}, biburl = {https://www.bibsonomy.org/bibtex/2e1f11bc0e07f2c6df06baa8432e6d465/dblp}, booktitle = {DFT}, crossref = {conf/dft/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/DFTVS.2001.966781}, interhash = {69d9c74ad483b8e7298705c407ca6183}, intrahash = {e1f11bc0e07f2c6df06baa8432e6d465}, isbn = {0-7695-1203-8}, keywords = {dblp}, pages = {287-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T12:57:00.000+0200}, title = {Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2001.html#YotsuyanagiHIIT01}, year = 2001 }