%0 Conference Paper %1 conf/iscas/MooreWGF17 %A Moore, Conrad J. %A Wang, Peikun %A Gharehbaghi, Amir Masoud %A Fujita, Masahiro %B ISCAS %D 2017 %I IEEE %K dblp %P 1-4 %T Test pattern generation for multiple stuck-at faults not covered by test patterns for single faults. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2017.html#MooreWGF17 %@ 978-1-4673-6853-7

@inproceedings{conf/iscas/MooreWGF17, added-at = {2018-11-02T00:00:00.000+0100}, author = {Moore, Conrad J. and Wang, Peikun and Gharehbaghi, Amir Masoud and Fujita, Masahiro}, biburl = {https://www.bibsonomy.org/bibtex/230d34aea7f27b82f564cab35c984cc27/dblp}, booktitle = {ISCAS}, crossref = {conf/iscas/2017}, ee = {https://doi.org/10.1109/ISCAS.2017.8050913}, interhash = {6b1ac4dded5c253e3219782bc3b7730d}, intrahash = {30d34aea7f27b82f564cab35c984cc27}, isbn = {978-1-4673-6853-7}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2018-11-03T15:20:41.000+0100}, title = {Test pattern generation for multiple stuck-at faults not covered by test patterns for single faults.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2017.html#MooreWGF17}, year = 2017 }