%0 Conference Paper %1 conf/vts/AkbayC05 %A Akbay, Selim Sermet %A Chatterjee, Abhijit %B VTS %D 2005 %I IEEE Computer Society %K dblp %P 243-248 %T Built-In Test of RF Components Using Mapped Feature Extraction Sensors. %U http://dblp.uni-trier.de/db/conf/vts/vts2005.html#AkbayC05 %@ 0-7695-2314-5

@inproceedings{conf/vts/AkbayC05, added-at = {2023-03-24T00:00:00.000+0100}, author = {Akbay, Selim Sermet and Chatterjee, Abhijit}, biburl = {https://www.bibsonomy.org/bibtex/2603fe16658793bd01baf2ea568c1fdee/dblp}, booktitle = {VTS}, crossref = {conf/vts/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTS.2005.33}, interhash = {6b96db0b8ac6667f74b76b59259b057f}, intrahash = {603fe16658793bd01baf2ea568c1fdee}, isbn = {0-7695-2314-5}, keywords = {dblp}, pages = {243-248}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:45:52.000+0200}, title = {Built-In Test of RF Components Using Mapped Feature Extraction Sensors.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2005.html#AkbayC05}, year = 2005 }