%0 Conference Paper %1 conf/icicdt/MitaniM15 %A Mitani, Yuichiro %A Matsuzawa, Kazuya %B ICICDT %D 2015 %I IEEE %K dblp %P 1-4 %T Simple technique for prediction of breakdown voltage of ultrathin gate insulator under ESD testing. %U http://dblp.uni-trier.de/db/conf/icicdt/icicdt2015.html#MitaniM15 %@ 978-1-4799-7669-0

@inproceedings{conf/icicdt/MitaniM15, added-at = {2016-05-17T00:00:00.000+0200}, author = {Mitani, Yuichiro and Matsuzawa, Kazuya}, biburl = {https://www.bibsonomy.org/bibtex/2a996b40f404c6c4f3e6b930477d870a6/dblp}, booktitle = {ICICDT}, crossref = {conf/icicdt/2015}, ee = {http://dx.doi.org/10.1109/ICICDT.2015.7165892}, interhash = {6bce8b5cc28b6a19349df1bcd8262c05}, intrahash = {a996b40f404c6c4f3e6b930477d870a6}, isbn = {978-1-4799-7669-0}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2016-05-18T11:45:05.000+0200}, title = {Simple technique for prediction of breakdown voltage of ultrathin gate insulator under ESD testing.}, url = {http://dblp.uni-trier.de/db/conf/icicdt/icicdt2015.html#MitaniM15}, year = 2015 }