%0 Journal Article %1 journals/mr/WuMRDGLR03 %A Wu, C.-T. %A Mieckowski, A. %A Ridley, R. S. %A Dolny, G. %A Grebs, T. %A Linn, J. %A Ruzyllo, Jerzy %D 2003 %J Microelectron. Reliab. %K dblp %N 1 %P 43-47 %T Effect of nitridation on the reliability of thick gate oxides. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#WuMRDGLR03 %V 43

@article{journals/mr/WuMRDGLR03, added-at = {2020-05-07T00:00:00.000+0200}, author = {Wu, C.-T. and Mieckowski, A. and Ridley, R. S. and Dolny, G. and Grebs, T. and Linn, J. and Ruzyllo, Jerzy}, biburl = {https://www.bibsonomy.org/bibtex/2fcecd6401524d25faff1b11b8c090f49/dblp}, ee = {https://doi.org/10.1016/S0026-2714(02)00122-1}, interhash = {6d353de3c15573f8c7a6ca053dde5bdd}, intrahash = {fcecd6401524d25faff1b11b8c090f49}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 1, pages = {43-47}, timestamp = {2020-05-08T11:40:17.000+0200}, title = {Effect of nitridation on the reliability of thick gate oxides.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#WuMRDGLR03}, volume = 43, year = 2003 }