%0 Conference Paper %1 conf/irps/RheePPHPMP24 %A Rhee, SungMan %A Park, Sung-Pyo %A Park, Sangku %A Hwang, Yuchul %A Pae, Sangwoo %A Meng, Jun %A Park, Yoonju %B IRPS %D 2024 %I IEEE %K dblp %P 1-6 %T V-Ramp VBD Prediction Method Using OCD-Spectrum and Deep-Learning, and Application to Early Detection of V-NAND Low Metal Reliability Risk. %U http://dblp.uni-trier.de/db/conf/irps/irps2024.html#RheePPHPMP24 %@ 979-8-3503-6976-2

@inproceedings{conf/irps/RheePPHPMP24, added-at = {2024-05-29T00:00:00.000+0200}, author = {Rhee, SungMan and Park, Sung-Pyo and Park, Sangku and Hwang, Yuchul and Pae, Sangwoo and Meng, Jun and Park, Yoonju}, biburl = {https://www.bibsonomy.org/bibtex/2ae9ee377201ce26fd6b65f1e0084fa6f/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2024}, ee = {https://doi.org/10.1109/IRPS48228.2024.10529423}, interhash = {6f9983d5d411cc7c12b2528553b2b9a9}, intrahash = {ae9ee377201ce26fd6b65f1e0084fa6f}, isbn = {979-8-3503-6976-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-06-03T07:16:33.000+0200}, title = {V-Ramp VBD Prediction Method Using OCD-Spectrum and Deep-Learning, and Application to Early Detection of V-NAND Low Metal Reliability Risk.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2024.html#RheePPHPMP24}, year = 2024 }