%0 Journal Article %1 journals/mr/KeppensHIVG02 %A Keppens, Bart %A Heyn, Vincent De %A Iyer, M. Natarajan %A Vassilev, Vesselin K. %A Groeseneken, Guido %D 2002 %J Microelectron. Reliab. %K dblp %N 6 %P 901-907 %T Significance of the failure criterion on transmission line pulse testing. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#KeppensHIVG02 %V 42

@article{journals/mr/KeppensHIVG02, added-at = {2020-02-22T00:00:00.000+0100}, author = {Keppens, Bart and Heyn, Vincent De and Iyer, M. Natarajan and Vassilev, Vesselin K. and Groeseneken, Guido}, biburl = {https://www.bibsonomy.org/bibtex/2c35f250846951ea7959a3bafe950546b/dblp}, ee = {https://doi.org/10.1016/S0026-2714(02)00053-7}, interhash = {6fc1b37cd3247146f416657a1613bdac}, intrahash = {c35f250846951ea7959a3bafe950546b}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 6, pages = {901-907}, timestamp = {2020-02-25T13:25:59.000+0100}, title = {Significance of the failure criterion on transmission line pulse testing.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#KeppensHIVG02}, volume = 42, year = 2002 }