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%0 Conference Paper
%1 conf/ets/CiliciBMLB18
%A Cilici, Florent
%A Barragán, Manuel J.
%A Mir, Salvador
%A Lauga-Larroze, Estelle
%A Bourdel, Sylvain
%B ETS
%D 2018
%I IEEE
%K dblp
%P 1-6
%T Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits.
%U http://dblp.uni-trier.de/db/conf/ets/ets2018.html#CiliciBMLB18
%@ 978-1-5386-3728-9
@inproceedings{conf/ets/CiliciBMLB18,
added-at = {2023-06-28T00:00:00.000+0200},
author = {Cilici, Florent and Barragán, Manuel J. and Mir, Salvador and Lauga-Larroze, Estelle and Bourdel, Sylvain},
biburl = {https://www.bibsonomy.org/bibtex/20b5f1b60d9af005285af8bf69a2ebab1/dblp},
booktitle = {ETS},
crossref = {conf/ets/2018},
ee = {https://doi.org/10.1109/ETS.2018.8400689},
interhash = {700d981ffbd61506ac7029b664b2ff07},
intrahash = {0b5f1b60d9af005285af8bf69a2ebab1},
isbn = {978-1-5386-3728-9},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2024-04-10T20:48:19.000+0200},
title = {Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits.},
url = {http://dblp.uni-trier.de/db/conf/ets/ets2018.html#CiliciBMLB18},
year = 2018
}