Article,
Oscillation-Based Test Applied to a Wideband CCII.
P. Petrashin, L. Toledo, W. Lancioni, P. Osuch, and T. Stander.VLSI Design, (2017)
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- 2017
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- VLSI Design
- pages
- 5075103:1-5075103:6
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- 2017
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- https://www.wikidata.org/entity/Q59148339
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- please select -%0 Journal Article
%1 journals/vlsi/PetrashinTLOS17
%A Petrashin, Pablo A.
%A Toledo, Luis E.
%A Lancioni, Walter J.
%A Osuch, Piotr J.
%A Stander, Tinus
%D 2017
%J VLSI Design
%K dblp
%P 5075103:1-5075103:6
%T Oscillation-Based Test Applied to a Wideband CCII.
%U http://dblp.uni-trier.de/db/journals/vlsi/vlsi2017.html#PetrashinTLOS17
%V 2017
@article{journals/vlsi/PetrashinTLOS17,
added-at = {2019-06-02T00:00:00.000+0200},
author = {Petrashin, Pablo A. and Toledo, Luis E. and Lancioni, Walter J. and Osuch, Piotr J. and Stander, Tinus},
biburl = {https://www.bibsonomy.org/bibtex/2967d72b4504e3e99367081bc0cf5f729/dblp},
ee = {https://www.wikidata.org/entity/Q59148339},
interhash = {7206e0a022717951785553eab7bd6263},
intrahash = {967d72b4504e3e99367081bc0cf5f729},
journal = {VLSI Design},
keywords = {dblp},
pages = {5075103:1-5075103:6},
timestamp = {2019-06-04T11:47:18.000+0200},
title = {Oscillation-Based Test Applied to a Wideband CCII.},
url = {http://dblp.uni-trier.de/db/journals/vlsi/vlsi2017.html#PetrashinTLOS17},
volume = 2017,
year = 2017
}