%0 Conference Paper %1 conf/itc/SchuermyerRD04 %A Schuermyer, Chris %A Ruffler, Jens %A Daasch, W. Robert %B ITC %D 2004 %I IEEE Computer Society %K dblp %P 300-308 %T Minimum Testing Requirements to Screen Temperature Dependent Defects. %U http://dblp.uni-trier.de/db/conf/itc/itc2004.html#SchuermyerRD04 %@ 0-7803-8581-0

@inproceedings{conf/itc/SchuermyerRD04, added-at = {2023-03-23T00:00:00.000+0100}, author = {Schuermyer, Chris and Ruffler, Jens and Daasch, W. Robert}, biburl = {https://www.bibsonomy.org/bibtex/22026d92053531c3f7f3fc993ea14a2af/dblp}, booktitle = {ITC}, crossref = {conf/itc/2004}, ee = {https://doi.ieeecomputersociety.org/10.1109/ITC.2004.121}, interhash = {74020fe758a1fb813f1cf6b680899f39}, intrahash = {2026d92053531c3f7f3fc993ea14a2af}, isbn = {0-7803-8581-0}, keywords = {dblp}, pages = {300-308}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:27:43.000+0200}, title = {Minimum Testing Requirements to Screen Temperature Dependent Defects.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2004.html#SchuermyerRD04}, year = 2004 }