%0 Conference Paper %1 conf/iscas/DingCCWZWY22 %A Ding, Luchang %A Cai, Chang %A Chen, Gengsheng %A Wu, Zehao %A Zhang, Jing %A Wu, Chang %A Yu, Jun %B ISCAS %D 2022 %I IEEE %K dblp %P 2281-2285 %T Characterization of Single Event Upsets of Nanoscale FDSOI Circuits Based on the Simulation and Irradiation Results. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2022.html#DingCCWZWY22 %@ 978-1-6654-8485-5

@inproceedings{conf/iscas/DingCCWZWY22, added-at = {2023-04-30T00:00:00.000+0200}, author = {Ding, Luchang and Cai, Chang and Chen, Gengsheng and Wu, Zehao and Zhang, Jing and Wu, Chang and Yu, Jun}, biburl = {https://www.bibsonomy.org/bibtex/2c0a9c06e2ff5c00a88b8c3cf41863bb1/dblp}, booktitle = {ISCAS}, crossref = {conf/iscas/2022}, ee = {https://doi.org/10.1109/ISCAS48785.2022.9937652}, interhash = {74961ab12e2e7616b6fc2953dd3c27dc}, intrahash = {c0a9c06e2ff5c00a88b8c3cf41863bb1}, isbn = {978-1-6654-8485-5}, keywords = {dblp}, pages = {2281-2285}, publisher = {IEEE}, timestamp = {2024-04-09T21:29:44.000+0200}, title = {Characterization of Single Event Upsets of Nanoscale FDSOI Circuits Based on the Simulation and Irradiation Results.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2022.html#DingCCWZWY22}, year = 2022 }