%0 Conference Paper %1 conf/ats/MishraSSSCS10 %A Mishra, Amit %A Sinha, Nidhi %A Satdev, %A Singh, Virendra %A Chakravarty, Sreejit %A Singh, Adit D. %B Asian Test Symposium %D 2010 %I IEEE Computer Society %K dblp %P 367-370 %T Modified Scan Flip-Flop for Low Power Testing. %U http://dblp.uni-trier.de/db/conf/ats/ats2010.html#MishraSSSCS10 %@ 978-0-7695-4248-5

@inproceedings{conf/ats/MishraSSSCS10, added-at = {2023-03-24T00:00:00.000+0100}, author = {Mishra, Amit and Sinha, Nidhi and Satdev and Singh, Virendra and Chakravarty, Sreejit and Singh, Adit D.}, biburl = {https://www.bibsonomy.org/bibtex/2c625396b866888e240329e6e7f960176/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2010}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2010.69}, interhash = {7605e0dbbfd9fc007d93749b44725528}, intrahash = {c625396b866888e240329e6e7f960176}, isbn = {978-0-7695-4248-5}, keywords = {dblp}, pages = {367-370}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:56.000+0200}, title = {Modified Scan Flip-Flop for Low Power Testing.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2010.html#MishraSSSCS10}, year = 2010 }