%0 Journal Article %1 journals/mr/MahdaviM10 %A Mahdavi, Seyyed Javad Seyyed %A Mohammadi, Karim %D 2010 %J Microelectron. Reliab. %K dblp %N 3 %P 415-423 %T Reliability enhancement of digital combinational circuits based on evolutionary approach. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#MahdaviM10 %V 50

@article{journals/mr/MahdaviM10, added-at = {2020-02-22T00:00:00.000+0100}, author = {Mahdavi, Seyyed Javad Seyyed and Mohammadi, Karim}, biburl = {https://www.bibsonomy.org/bibtex/2d9e5cb2e7b6599a83f3ef9ec0ed895b8/dblp}, ee = {https://doi.org/10.1016/j.microrel.2009.11.016}, interhash = {77515e4bee0c90c252582d2e63edeeea}, intrahash = {d9e5cb2e7b6599a83f3ef9ec0ed895b8}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 3, pages = {415-423}, timestamp = {2020-02-25T13:28:02.000+0100}, title = {Reliability enhancement of digital combinational circuits based on evolutionary approach.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#MahdaviM10}, volume = 50, year = 2010 }