%0 Conference Paper %1 conf/ats/HashizumeKT97 %A Hashizume, Masaki %A Kuchii, Toshimasa %A Tamesada, Takeomi %B Asian Test Symposium %D 1997 %I IEEE Computer Society %K dblp %P 372-377 %T Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates. %U http://dblp.uni-trier.de/db/conf/ats/ats1997.html#HashizumeKT97 %@ 0-8186-8209-4

@inproceedings{conf/ats/HashizumeKT97, added-at = {2023-03-24T00:00:00.000+0100}, author = {Hashizume, Masaki and Kuchii, Toshimasa and Tamesada, Takeomi}, biburl = {https://www.bibsonomy.org/bibtex/2a523625500365435b653a42386f26b5a/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643985}, interhash = {77594bc6d31af7f13dcb9df5baf00d99}, intrahash = {a523625500365435b653a42386f26b5a}, isbn = {0-8186-8209-4}, keywords = {dblp}, pages = {372-377}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:16.000+0200}, title = {Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1997.html#HashizumeKT97}, year = 1997 }