%0 Conference Paper %1 conf/irps/YamagishiC19 %A Yamagishi, Yuji %A Cho, Yasuo %B IRPS %D 2019 %I IEEE %K dblp %P 1-4 %T High Resolution Observation of Subsurface Defects at SiO2/4H-SiC Interfaces by Local Deep Level Transient Spectroscopy Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy. %U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#YamagishiC19 %@ 978-1-5386-9504-3

@inproceedings{conf/irps/YamagishiC19, added-at = {2019-05-31T00:00:00.000+0200}, author = {Yamagishi, Yuji and Cho, Yasuo}, biburl = {https://www.bibsonomy.org/bibtex/242ab3b5cd33e4cb5227e84645e8fb358/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2019}, ee = {https://doi.org/10.1109/IRPS.2019.8720482}, interhash = {77797a98c9fe8d9a668ba76241205cc8}, intrahash = {42ab3b5cd33e4cb5227e84645e8fb358}, isbn = {978-1-5386-9504-3}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2019-10-17T14:45:22.000+0200}, title = {High Resolution Observation of Subsurface Defects at SiO2/4H-SiC Interfaces by Local Deep Level Transient Spectroscopy Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#YamagishiC19}, year = 2019 }