%0 Conference Paper %1 conf/irps/YoshimuraOS18 %A Yoshimura, Yoko %A Ota, Kensuke %A Saitoh, Masumi %B IRPS %D 2018 %I IEEE %K dblp %P 5 %T Hot carrier degradation, TDDB, and 1/f noise in Poly-Si Tri-gate nanowire transistor. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#YoshimuraOS18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/YoshimuraOS18, added-at = {2019-01-22T00:00:00.000+0100}, author = {Yoshimura, Yoko and Ota, Kensuke and Saitoh, Masumi}, biburl = {https://www.bibsonomy.org/bibtex/2b373c1b055377d8d1547c0493881c521/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353606}, interhash = {77fd4de867a062a397b6283f8c592b63}, intrahash = {b373c1b055377d8d1547c0493881c521}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = 5, publisher = {IEEE}, timestamp = {2019-10-17T14:45:36.000+0200}, title = {Hot carrier degradation, TDDB, and 1/f noise in Poly-Si Tri-gate nanowire transistor.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#YoshimuraOS18}, year = 2018 }