%0 Journal Article %1 journals/mr/NavarroSPSNJADCPS12 %A Navarro, Gabriele %A Souiki, Sarra %A Persico, Alain %A Sousa, Veronique %A Nodin, Jean-François %A Jahan, Carine %A Aussenac, François %A Delaye, Vincent %A Cueto, Olga %A Perniola, Luca %A Salvo, Barbara De %D 2012 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1928-1931 %T High temperature reliability of μtrench Phase-Change Memory devices. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#NavarroSPSNJADCPS12 %V 52

@article{journals/mr/NavarroSPSNJADCPS12, added-at = {2024-10-06T00:00:00.000+0200}, author = {Navarro, Gabriele and Souiki, Sarra and Persico, Alain and Sousa, Veronique and Nodin, Jean-François and Jahan, Carine and Aussenac, François and Delaye, Vincent and Cueto, Olga and Perniola, Luca and Salvo, Barbara De}, biburl = {https://www.bibsonomy.org/bibtex/2a80b31b04f8132358816d0cfc42f905b/dblp}, ee = {https://doi.org/10.1016/j.microrel.2012.06.017}, interhash = {7859362d7675c2af2a435357eb56a454}, intrahash = {a80b31b04f8132358816d0cfc42f905b}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1928-1931}, timestamp = {2024-10-07T07:57:43.000+0200}, title = {High temperature reliability of μtrench Phase-Change Memory devices.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#NavarroSPSNJADCPS12}, volume = 52, year = 2012 }