%0 Conference Paper %1 conf/imw2/KimPJYWCR24 %A Kim, W. %A Pica, V. %A Jossart, N. %A Yasin, Farrukh %A Wostyn, Kurt %A Couet, S. %A Rao, Sidharth %B IMW %D 2024 %I IEEE %K dblp %P 1-4 %T A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays. %U http://dblp.uni-trier.de/db/conf/imw2/imw2024.html#KimPJYWCR24 %@ 979-8-3503-0652-1

@inproceedings{conf/imw2/KimPJYWCR24, added-at = {2024-06-10T00:00:00.000+0200}, author = {Kim, W. and Pica, V. and Jossart, N. and Yasin, Farrukh and Wostyn, Kurt and Couet, S. and Rao, Sidharth}, biburl = {https://www.bibsonomy.org/bibtex/2e6c57180e452da2fb7e98cf7ae541a80/dblp}, booktitle = {IMW}, crossref = {conf/imw2/2024}, ee = {https://doi.org/10.1109/IMW59701.2024.10536950}, interhash = {7a3526693b15474d4d2ac08528e8283e}, intrahash = {e6c57180e452da2fb7e98cf7ae541a80}, isbn = {979-8-3503-0652-1}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-06-17T07:42:02.000+0200}, title = {A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays.}, url = {http://dblp.uni-trier.de/db/conf/imw2/imw2024.html#KimPJYWCR24}, year = 2024 }