%0 Conference Paper %1 conf/iecon/ChaJLKK23 %A Cha, Jae-Hun %A Jo, Jae-Sung %A Lim, Seong-Jin %A soon Kang, Feel %A Kim, Tae-Jin %B IECON %D 2023 %I IEEE %K dblp %P 1-6 %T Comparison of Failure Rates According to Secondary Circuit Configurations of Full-Bridge Converters Using Fault-Tree Analysis. %U http://dblp.uni-trier.de/db/conf/iecon/iecon2023.html#ChaJLKK23 %@ 979-8-3503-3182-0

@inproceedings{conf/iecon/ChaJLKK23, added-at = {2023-11-25T00:00:00.000+0100}, author = {Cha, Jae-Hun and Jo, Jae-Sung and Lim, Seong-Jin and soon Kang, Feel and Kim, Tae-Jin}, biburl = {https://www.bibsonomy.org/bibtex/263c4ed8c1d9739d6b8099555c0a6982e/dblp}, booktitle = {IECON}, crossref = {conf/iecon/2023}, ee = {https://doi.org/10.1109/IECON51785.2023.10312381}, interhash = {7b3fc73a5d0a0bf89732d2a322a46fce}, intrahash = {63c4ed8c1d9739d6b8099555c0a6982e}, isbn = {979-8-3503-3182-0}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T17:55:37.000+0200}, title = {Comparison of Failure Rates According to Secondary Circuit Configurations of Full-Bridge Converters Using Fault-Tree Analysis.}, url = {http://dblp.uni-trier.de/db/conf/iecon/iecon2023.html#ChaJLKK23}, year = 2023 }