%0 Journal Article %1 journals/mr/MahdaviM11 %A Mahdavi, Seyyed Javad Seyyed %A Mohammadi, Karim %D 2011 %J Microelectron. Reliab. %K dblp %N 2 %P 477-484 %T Improved single-pass approach for reliability analysis of digital combinational circuits. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#MahdaviM11 %V 51

@article{journals/mr/MahdaviM11, added-at = {2020-02-22T00:00:00.000+0100}, author = {Mahdavi, Seyyed Javad Seyyed and Mohammadi, Karim}, biburl = {https://www.bibsonomy.org/bibtex/27c112fedc5925f838fc6b178c1ad95d4/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.08.011}, interhash = {7b931f1112256690e412267a86f3285a}, intrahash = {7c112fedc5925f838fc6b178c1ad95d4}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 2, pages = {477-484}, timestamp = {2020-02-25T13:26:24.000+0100}, title = {Improved single-pass approach for reliability analysis of digital combinational circuits.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#MahdaviM11}, volume = 51, year = 2011 }