%0 Conference Paper %1 conf/nvmts/PapandreouIPPSS19 %A Papandreou, Nikolaos %A Ioannou, Nikolas %A Parnell, Thomas P. %A Pletka, Roman A. %A Stanisavljevic, Milos %A Stoica, Radu %A Tomic, Sasa %A Pozidis, Haralampos %B NVMTS %D 2019 %I IEEE %K dblp %P 1-4 %T Reliability of 3D NAND flash memory with a focus on read voltage calibration from a system aspect. %U http://dblp.uni-trier.de/db/conf/nvmts/nvmts2019.html#PapandreouIPPSS19 %@ 978-1-7281-4431-3

@inproceedings{conf/nvmts/PapandreouIPPSS19, added-at = {2022-06-23T00:00:00.000+0200}, author = {Papandreou, Nikolaos and Ioannou, Nikolas and Parnell, Thomas P. and Pletka, Roman A. and Stanisavljevic, Milos and Stoica, Radu and Tomic, Sasa and Pozidis, Haralampos}, biburl = {https://www.bibsonomy.org/bibtex/2a2170a980ed6f98a24ea622f82e53298/dblp}, booktitle = {NVMTS}, crossref = {conf/nvmts/2019}, ee = {https://doi.org/10.1109/NVMTS47818.2019.8986221}, interhash = {7c70ff05d6e50d769145bd59cbee19b1}, intrahash = {a2170a980ed6f98a24ea622f82e53298}, isbn = {978-1-7281-4431-3}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-04-10T13:13:34.000+0200}, title = {Reliability of 3D NAND flash memory with a focus on read voltage calibration from a system aspect.}, url = {http://dblp.uni-trier.de/db/conf/nvmts/nvmts2019.html#PapandreouIPPSS19}, year = 2019 }