A Comprehensive Hot Carrier Injection with Voltage Ramp Stress (HCI-VRS) through Different Model Verification for More than Moore Diversity Application.
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%0 Conference Paper
%1 conf/irps/ChiangSHL24
%A Chiang, C. H.
%A Sou, K. P.
%A Huang, D. S.
%A Lee, J. H.
%B IRPS
%D 2024
%I IEEE
%K dblp
%P 1-4
%T A Comprehensive Hot Carrier Injection with Voltage Ramp Stress (HCI-VRS) through Different Model Verification for More than Moore Diversity Application.
%U http://dblp.uni-trier.de/db/conf/irps/irps2024.html#ChiangSHL24
%@ 979-8-3503-6976-2
@inproceedings{conf/irps/ChiangSHL24,
added-at = {2024-05-29T00:00:00.000+0200},
author = {Chiang, C. H. and Sou, K. P. and Huang, D. S. and Lee, J. H.},
biburl = {https://www.bibsonomy.org/bibtex/2673a2196f2a02e93a61bbfb72a1bd59e/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2024},
ee = {https://doi.org/10.1109/IRPS48228.2024.10529412},
interhash = {7d8cf5e086f2f50eccc19ce45ea545cd},
intrahash = {673a2196f2a02e93a61bbfb72a1bd59e},
isbn = {979-8-3503-6976-2},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2024-06-03T07:16:33.000+0200},
title = {A Comprehensive Hot Carrier Injection with Voltage Ramp Stress (HCI-VRS) through Different Model Verification for More than Moore Diversity Application.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2024.html#ChiangSHL24},
year = 2024
}
