%0 Journal Article %1 journals/iee/NairST12 %A Nair, T. R. Gopalakrishnan %A Suma, V. %A Tiwari, Pranesh Kumar %D 2012 %J IET Softw. %K dblp %N 6 %P 524-535 %T Significance of depth of inspection and inspection performance metrics for consistent defect management in software industry. %U http://dblp.uni-trier.de/db/journals/iet-sen/iet-sen6.html#NairST12 %V 6

@article{journals/iee/NairST12, added-at = {2020-05-22T00:00:00.000+0200}, author = {Nair, T. R. Gopalakrishnan and Suma, V. and Tiwari, Pranesh Kumar}, biburl = {https://www.bibsonomy.org/bibtex/237368486e9331f0b9db44b7d46664b9c/dblp}, ee = {https://doi.org/10.1049/iet-sen.2011.0148}, interhash = {7def1fc920e6c3a52a45fdacbcafaf9b}, intrahash = {37368486e9331f0b9db44b7d46664b9c}, journal = {IET Softw.}, keywords = {dblp}, number = 6, pages = {524-535}, timestamp = {2020-05-23T11:55:56.000+0200}, title = {Significance of depth of inspection and inspection performance metrics for consistent defect management in software industry.}, url = {http://dblp.uni-trier.de/db/journals/iet-sen/iet-sen6.html#NairST12}, volume = 6, year = 2012 }