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%0 Journal Article
%1 journals/tvlsi/ChenMBR05
%A Chen, Qikai
%A Mahmoodi-Meimand, Hamid
%A Bhunia, Swarup
%A Roy, Kaushik
%D 2005
%J IEEE Trans. Very Large Scale Integr. Syst.
%K dblp
%N 11
%P 1286-1295
%T Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations.
%U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi13.html#ChenMBR05
%V 13
@article{journals/tvlsi/ChenMBR05,
added-at = {2024-05-07T00:00:00.000+0200},
author = {Chen, Qikai and Mahmoodi-Meimand, Hamid and Bhunia, Swarup and Roy, Kaushik},
biburl = {https://www.bibsonomy.org/bibtex/2f50bcd5df3a05d614a79bcb856261084/dblp},
ee = {https://doi.org/10.1109/TVLSI.2005.859565},
interhash = {17f8185c1b746bb9dbd80289555ceacf},
intrahash = {f50bcd5df3a05d614a79bcb856261084},
journal = {IEEE Trans. Very Large Scale Integr. Syst.},
keywords = {dblp},
number = 11,
pages = {1286-1295},
timestamp = {2024-05-13T07:13:35.000+0200},
title = {Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations.},
url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi13.html#ChenMBR05},
volume = 13,
year = 2005
}