%0 Journal Article %1 journals/mr/AckaertCDVSMVBIBVR08 %A Ackaert, Jan %A Charavel, R. %A Dhondt, K. %A Vlachakis, B. %A Schepper, Luc De %A Millecam, M. %A Vandevelde, E. %A Bogaert, P. %A Iline, A. %A Backer, Eddy De %A Vlad, Alexandru %A Raskin, Jean-Pierre %D 2008 %J Microelectron. Reliab. %K dblp %N 8-9 %P 1553-1556 %T MIMC reliability and electrical behavior defined by a physical layer property of the dielectric. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#AckaertCDVSMVBIBVR08 %V 48

@article{journals/mr/AckaertCDVSMVBIBVR08, added-at = {2021-04-21T00:00:00.000+0200}, author = {Ackaert, Jan and Charavel, R. and Dhondt, K. and Vlachakis, B. and Schepper, Luc De and Millecam, M. and Vandevelde, E. and Bogaert, P. and Iline, A. and Backer, Eddy De and Vlad, Alexandru and Raskin, Jean-Pierre}, biburl = {https://www.bibsonomy.org/bibtex/2eb58370658f7de935b740899a614a000/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.06.043}, interhash = {180596139caf106e77654aaf7f480615}, intrahash = {eb58370658f7de935b740899a614a000}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {8-9}, pages = {1553-1556}, timestamp = {2024-04-09T02:49:06.000+0200}, title = {MIMC reliability and electrical behavior defined by a physical layer property of the dielectric.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#AckaertCDVSMVBIBVR08}, volume = 48, year = 2008 }