%0 Conference Paper %1 conf/isqed/Heinrich-BarnaD17 %A Heinrich-Barna, Stephen K. %A Dunn, Clyde %A Verret, Doug %B ISQED %D 2017 %I IEEE %K dblp %P 87-92 %T Low temperature endurance failures on flash memory. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2017.html#Heinrich-BarnaD17 %@ 978-1-5090-5404-6

@inproceedings{conf/isqed/Heinrich-BarnaD17, added-at = {2020-07-30T00:00:00.000+0200}, author = {Heinrich-Barna, Stephen K. and Dunn, Clyde and Verret, Doug}, biburl = {https://www.bibsonomy.org/bibtex/2a02b17a49b69ec65d7ea2e8e8addb530/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2017}, ee = {https://doi.org/10.1109/ISQED.2017.7918298}, interhash = {80d7dd41c2376cf02a15ad6777b532b3}, intrahash = {a02b17a49b69ec65d7ea2e8e8addb530}, isbn = {978-1-5090-5404-6}, keywords = {dblp}, pages = {87-92}, publisher = {IEEE}, timestamp = {2020-07-31T11:52:28.000+0200}, title = {Low temperature endurance failures on flash memory.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2017.html#Heinrich-BarnaD17}, year = 2017 }