%0 Journal Article %1 journals/tcad/KunduPCSK13 %A Kundu, Subhadip %A Pal, Sankhadeep %A Chattopadhyay, Santanu %A Sengupta, Indranil %A Kapur, Rohit %D 2013 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 11 %P 1824-1828 %T A Metric for Test Set Characterization and Customization Toward Fault Diagnosis. %U http://dblp.uni-trier.de/db/journals/tcad/tcad32.html#KunduPCSK13 %V 32

@article{journals/tcad/KunduPCSK13, added-at = {2020-09-24T00:00:00.000+0200}, author = {Kundu, Subhadip and Pal, Sankhadeep and Chattopadhyay, Santanu and Sengupta, Indranil and Kapur, Rohit}, biburl = {https://www.bibsonomy.org/bibtex/278f742b7c39e31f2ebf12b44d2d5de13/dblp}, ee = {https://doi.org/10.1109/TCAD.2013.2272538}, interhash = {80faee3d8a765b95f0408ba4aa0b452b}, intrahash = {78f742b7c39e31f2ebf12b44d2d5de13}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 11, pages = {1824-1828}, timestamp = {2020-09-25T11:47:33.000+0200}, title = {A Metric for Test Set Characterization and Customization Toward Fault Diagnosis.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad32.html#KunduPCSK13}, volume = 32, year = 2013 }