%0 Conference Paper %1 conf/itc/DoreyJRRX88 %A Dorey, A. P. %A Jones, B. K. %A Richardson, Andrew M. D. %A Russell, P. C. %A Xu, Y. Z. %B ITC %D 1988 %I IEEE Computer Society %K dblp %P 369-373 %T Reliability Testing by Precise Electrical Measurement. %U http://dblp.uni-trier.de/db/conf/itc/itc1988.html#DoreyJRRX88 %@ 0-8186-0870-6

@inproceedings{conf/itc/DoreyJRRX88, added-at = {2017-05-24T00:00:00.000+0200}, author = {Dorey, A. P. and Jones, B. K. and Richardson, Andrew M. D. and Russell, P. C. and Xu, Y. Z.}, biburl = {https://www.bibsonomy.org/bibtex/2218607595972e1b069db2551ce434877/dblp}, booktitle = {ITC}, crossref = {conf/itc/1988}, ee = {https://doi.org/10.1109/TEST.1988.207823}, interhash = {8129fbb37759437999812020e5cfb4ef}, intrahash = {218607595972e1b069db2551ce434877}, isbn = {0-8186-0870-6}, keywords = {dblp}, pages = {369-373}, publisher = {IEEE Computer Society}, timestamp = {2019-02-14T11:45:31.000+0100}, title = {Reliability Testing by Precise Electrical Measurement.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1988.html#DoreyJRRX88}, year = 1988 }