%0 Conference Paper %1 conf/vlsi-dat/LinWC15 %A Lin, Bing-Yang %A Wu, Cheng-Wen %A Chen, Harry H. %B VLSI-DAT %D 2015 %I IEEE %K dblp %P 1-4 %T System-level test coverage prediction by structural stress test data mining. %U http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2015.html#LinWC15 %@ 978-1-4799-6275-4

@inproceedings{conf/vlsi-dat/LinWC15, added-at = {2023-09-30T00:00:00.000+0200}, author = {Lin, Bing-Yang and Wu, Cheng-Wen and Chen, Harry H.}, biburl = {https://www.bibsonomy.org/bibtex/2edad34363e66823a083292e7179db085/dblp}, booktitle = {VLSI-DAT}, crossref = {conf/vlsi-dat/2015}, ee = {https://doi.org/10.1109/VLSI-DAT.2015.7114508}, interhash = {829d852d5458f88a9932936df0fcd018}, intrahash = {edad34363e66823a083292e7179db085}, isbn = {978-1-4799-6275-4}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-04-10T19:50:05.000+0200}, title = {System-level test coverage prediction by structural stress test data mining.}, url = {http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2015.html#LinWC15}, year = 2015 }