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- BibTeX key
- conf/irps/YuLZXSKBWA20
- entry type
- inproceedings
- booktitle
- IRPS
- year
- 2020
- pages
- 1-5
- publisher
- IEEE
- crossref
- conf/irps/2020
- ee
- https://doi.org/10.1109/IRPS45951.2020.9129071
- isbn
- 978-1-7281-3199-3
- url
- http://dblp.uni-trier.de/db/conf/irps/irps2020.html#YuLZXSKBWA20
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- please select -%0 Conference Paper
%1 conf/irps/YuLZXSKBWA20
%A Yu, Susanna
%A Liu, Tianshi
%A Zhu, Shengnan
%A Xing, Diang
%A Salemi, Arash
%A Kang, Minseok
%A Booth, Kristen
%A White, Marvin H.
%A Agarwal, Anant K.
%B IRPS
%D 2020
%I IEEE
%K dblp
%P 1-5
%T Threshold Voltage Instability of Commercial 1.2 kV SiC Power MOSFETs.
%U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#YuLZXSKBWA20
%@ 978-1-7281-3199-3
@inproceedings{conf/irps/YuLZXSKBWA20,
added-at = {2023-09-30T00:00:00.000+0200},
author = {Yu, Susanna and Liu, Tianshi and Zhu, Shengnan and Xing, Diang and Salemi, Arash and Kang, Minseok and Booth, Kristen and White, Marvin H. and Agarwal, Anant K.},
biburl = {https://www.bibsonomy.org/bibtex/27389405975faf9b54d24aafe140d3cd5/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2020},
ee = {https://doi.org/10.1109/IRPS45951.2020.9129071},
interhash = {83010cb17d5416c2e152cdc9d72620b0},
intrahash = {7389405975faf9b54d24aafe140d3cd5},
isbn = {978-1-7281-3199-3},
keywords = {dblp},
pages = {1-5},
publisher = {IEEE},
timestamp = {2024-04-10T16:56:46.000+0200},
title = {Threshold Voltage Instability of Commercial 1.2 kV SiC Power MOSFETs.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#YuLZXSKBWA20},
year = 2020
}