%0 Conference Paper %1 conf/dac/AlawiehBP20 %A Alawieh, Mohamed Baker %A Boning, Duane S. %A Pan, David Z. %B DAC %D 2020 %I IEEE %K dblp %P 1-6 %T Wafer Map Defect Patterns Classification using Deep Selective Learning. %U http://dblp.uni-trier.de/db/conf/dac/dac2020.html#AlawiehBP20 %@ 978-1-7281-1085-1

@inproceedings{conf/dac/AlawiehBP20, added-at = {2021-07-23T00:00:00.000+0200}, author = {Alawieh, Mohamed Baker and Boning, Duane S. and Pan, David Z.}, biburl = {https://www.bibsonomy.org/bibtex/2f7b807ee391cf4f6e4305f45ca260cec/dblp}, booktitle = {DAC}, crossref = {conf/dac/2020}, ee = {https://doi.org/10.1109/DAC18072.2020.9218580}, interhash = {832fbd3fbc499a889e1418c88b175f67}, intrahash = {f7b807ee391cf4f6e4305f45ca260cec}, isbn = {978-1-7281-1085-1}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-10T06:55:34.000+0200}, title = {Wafer Map Defect Patterns Classification using Deep Selective Learning.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac2020.html#AlawiehBP20}, year = 2020 }