%0 Conference Paper %1 conf/itc/NighG04 %A Nigh, Phil %A Gattiker, Anne E. %B ITC %D 2004 %I IEEE Computer Society %K dblp %P 309-318 %T Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. %U http://dblp.uni-trier.de/db/conf/itc/itc2004.html#NighG04 %@ 0-7803-8581-0

@inproceedings{conf/itc/NighG04, added-at = {2023-03-23T00:00:00.000+0100}, author = {Nigh, Phil and Gattiker, Anne E.}, biburl = {https://www.bibsonomy.org/bibtex/28fa8afde72b95c76a9734ab0fe180b22/dblp}, booktitle = {ITC}, crossref = {conf/itc/2004}, ee = {https://doi.ieeecomputersociety.org/10.1109/ITC.2004.148}, interhash = {84412c0498dc1a4fe70e57903e27ae7d}, intrahash = {8fa8afde72b95c76a9734ab0fe180b22}, isbn = {0-7803-8581-0}, keywords = {dblp}, pages = {309-318}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:27:43.000+0200}, title = {Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2004.html#NighG04}, year = 2004 }