%0 Conference Paper %1 conf/irps/LeeTTT21 %A Lee, Tsung-En %A Toprasertpong, Kasidit %A Takenaka, Mitsuru %A Takagi, Shinichi %B IRPS %D 2021 %I IEEE %K dblp %P 1-4 %T Characterization of Slow Traps in SiGe MOS Interfaces by TiN/Y2O3 Gate Stacks. %U http://dblp.uni-trier.de/db/conf/irps/irps2021.html#LeeTTT21 %@ 978-1-7281-6893-7

@inproceedings{conf/irps/LeeTTT21, added-at = {2021-07-25T00:00:00.000+0200}, author = {Lee, Tsung-En and Toprasertpong, Kasidit and Takenaka, Mitsuru and Takagi, Shinichi}, biburl = {https://www.bibsonomy.org/bibtex/201a5d19b400cdc11c9eeda226dd62953/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2021}, ee = {https://doi.org/10.1109/IRPS46558.2021.9405189}, interhash = {86ce5735c30222500b512b0445e785dc}, intrahash = {01a5d19b400cdc11c9eeda226dd62953}, isbn = {978-1-7281-6893-7}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:55.000+0200}, title = {Characterization of Slow Traps in SiGe MOS Interfaces by TiN/Y2O3 Gate Stacks.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2021.html#LeeTTT21}, year = 2021 }