%0 Conference Paper %1 conf/wacv/HiroiSW02 %A Hiroi, Takashi %A Shishido, Chie %A Watanabe, Masahiro %B WACV %D 2002 %I IEEE Computer Society %K dblp %P 257-263 %T Pattern Alignment Method Based on Consistency Among Local Registration Candidates for LSI Wafer Pattern Inspection. %U http://dblp.uni-trier.de/db/conf/wacv/wacv2002.html#HiroiSW02 %@ 0-7695-1858-3

@inproceedings{conf/wacv/HiroiSW02, added-at = {2023-03-24T00:00:00.000+0100}, author = {Hiroi, Takashi and Shishido, Chie and Watanabe, Masahiro}, biburl = {https://www.bibsonomy.org/bibtex/222c25e59093b5b0da13a9350b9a7ccbe/dblp}, booktitle = {WACV}, crossref = {conf/wacv/2002}, ee = {https://doi.ieeecomputersociety.org/10.1109/ACV.2002.1182191}, interhash = {873fac351f9aa5e2a601c1ffc17d0f4b}, intrahash = {22c25e59093b5b0da13a9350b9a7ccbe}, isbn = {0-7695-1858-3}, keywords = {dblp}, pages = {257-263}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T05:31:53.000+0200}, title = {Pattern Alignment Method Based on Consistency Among Local Registration Candidates for LSI Wafer Pattern Inspection.}, url = {http://dblp.uni-trier.de/db/conf/wacv/wacv2002.html#HiroiSW02}, year = 2002 }