%0 Conference Paper %1 conf/irps/ZhangKLXZ20 %A Zhang, Ruizhe %A Kozak, Joseph P. %A Liu, Jingcun %A Xiao, Ming %A Zhang, Yuhao %B IRPS %D 2020 %I IEEE %K dblp %P 1-7 %T Surge Energy Robustness of GaN Gate Injection Transistors. %U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#ZhangKLXZ20 %@ 978-1-7281-3199-3

@inproceedings{conf/irps/ZhangKLXZ20, added-at = {2020-11-06T00:00:00.000+0100}, author = {Zhang, Ruizhe and Kozak, Joseph P. and Liu, Jingcun and Xiao, Ming and Zhang, Yuhao}, biburl = {https://www.bibsonomy.org/bibtex/2018d40a051ed1cd2222d7c802b46a9c3/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2020}, ee = {https://doi.org/10.1109/IRPS45951.2020.9129324}, interhash = {8837488ccf43f5bde2e362716d1e6b76}, intrahash = {018d40a051ed1cd2222d7c802b46a9c3}, isbn = {978-1-7281-3199-3}, keywords = {dblp}, pages = {1-7}, publisher = {IEEE}, timestamp = {2020-11-07T11:43:00.000+0100}, title = {Surge Energy Robustness of GaN Gate Injection Transistors.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#ZhangKLXZ20}, year = 2020 }