%0 Conference Paper %1 conf/mcsoc/ShiHW23 %A Shi, Shiling %A Holst, Stefan %A Wen, Xiaoqing %B MCSoC %D 2023 %I IEEE %K dblp %P 501-507 %T Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling. %U http://dblp.uni-trier.de/db/conf/mcsoc/mcsoc2023.html#ShiHW23 %@ 979-8-3503-9361-3

@inproceedings{conf/mcsoc/ShiHW23, added-at = {2024-02-09T00:00:00.000+0100}, author = {Shi, Shiling and Holst, Stefan and Wen, Xiaoqing}, biburl = {https://www.bibsonomy.org/bibtex/2da2e413b8b6a7f9691bb24463fb653b2/dblp}, booktitle = {MCSoC}, crossref = {conf/mcsoc/2023}, ee = {https://doi.org/10.1109/MCSoC60832.2023.00080}, interhash = {893ee62625c250ecd91cc486e487243d}, intrahash = {da2e413b8b6a7f9691bb24463fb653b2}, isbn = {979-8-3503-9361-3}, keywords = {dblp}, pages = {501-507}, publisher = {IEEE}, timestamp = {2024-04-09T12:47:26.000+0200}, title = {Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling.}, url = {http://dblp.uni-trier.de/db/conf/mcsoc/mcsoc2023.html#ShiHW23}, year = 2023 }