%0 Journal Article %1 journals/mr/ChenNAaRMNLM16 %A Chen, Changqing %A Ng, P. T. %A Ang, Ghinboon %A Tan, H. %A Rivai, Francis %A Ma, Y. Z. %A Ng, Huipeng %A Lam, Jeffrey %A Mai, Zhihong %D 2016 %J Microelectron. Reliab. %K dblp %P 317-320 %T Electrical analysis on implantation-related defect by nanoprobing methodology. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChenNAaRMNLM16 %V 64

@article{journals/mr/ChenNAaRMNLM16, added-at = {2021-06-10T00:00:00.000+0200}, author = {Chen, Changqing and Ng, P. T. and Ang, Ghinboon and Tan, H. and Rivai, Francis and Ma, Y. Z. and Ng, Huipeng and Lam, Jeffrey and Mai, Zhihong}, biburl = {https://www.bibsonomy.org/bibtex/299d221954b75158ca0e0fa31aa4b6f66/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.07.091}, interhash = {8a2cb3bc0c22375abe75cfb6251a9b7d}, intrahash = {99d221954b75158ca0e0fa31aa4b6f66}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {317-320}, timestamp = {2024-04-09T02:48:51.000+0200}, title = {Electrical analysis on implantation-related defect by nanoprobing methodology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChenNAaRMNLM16}, volume = 64, year = 2016 }