%0 Journal Article %1 journals/eaai/WeiW23 %A Wei, Yuxiang %A Wang, Huan %D 2023 %J Eng. Appl. Artif. Intell. %K dblp %P 105975 %T Wavelet integrated attention network with multi-resolution frequency learning for mixed-type wafer defect recognition. %U http://dblp.uni-trier.de/db/journals/eaai/eaai121.html#WeiW23 %V 121

@article{journals/eaai/WeiW23, added-at = {2023-04-29T00:00:00.000+0200}, author = {Wei, Yuxiang and Wang, Huan}, biburl = {https://www.bibsonomy.org/bibtex/2aee84c9d19e597a4b16f378f97d7508c/dblp}, ee = {https://doi.org/10.1016/j.engappai.2023.105975}, interhash = {8b26fa99bc710625cc1783491f550d03}, intrahash = {aee84c9d19e597a4b16f378f97d7508c}, journal = {Eng. Appl. Artif. Intell.}, keywords = {dblp}, month = May, pages = 105975, timestamp = {2024-04-09T02:56:50.000+0200}, title = {Wavelet integrated attention network with multi-resolution frequency learning for mixed-type wafer defect recognition.}, url = {http://dblp.uni-trier.de/db/journals/eaai/eaai121.html#WeiW23}, volume = 121, year = 2023 }