%0 Conference Paper %1 conf/irps/TengWKXG24 %A Teng, Qiao %A Wu, Yongyu %A Kang, Junzhe %A Xu, Kai %A Gao, Dawei %B IRPS %D 2024 %I IEEE %K dblp %P 1-4 %T Impact of Lightly Doped Drain on Hot Carrier Degradation Variability in N-FETs and SRAM Cells. %U http://dblp.uni-trier.de/db/conf/irps/irps2024.html#TengWKXG24 %@ 979-8-3503-6976-2

@inproceedings{conf/irps/TengWKXG24, added-at = {2024-05-29T00:00:00.000+0200}, author = {Teng, Qiao and Wu, Yongyu and Kang, Junzhe and Xu, Kai and Gao, Dawei}, biburl = {https://www.bibsonomy.org/bibtex/2ec6a473e5123c0802d96542ca4cb64ee/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2024}, ee = {https://doi.org/10.1109/IRPS48228.2024.10529417}, interhash = {8b44bd66ebc1c62dd4729e283f5a0fa5}, intrahash = {ec6a473e5123c0802d96542ca4cb64ee}, isbn = {979-8-3503-6976-2}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-06-03T07:16:33.000+0200}, title = {Impact of Lightly Doped Drain on Hot Carrier Degradation Variability in N-FETs and SRAM Cells.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2024.html#TengWKXG24}, year = 2024 }