%0 Journal Article %1 journals/et/KumarFS19 %A Kumar, Binod %A Fujita, Masahiro %A Singh, Virendra %D 2019 %J J. Electron. Test. %K dblp %N 5 %P 655-678 %T SAT-based Silicon Debug of Electrical Errors under Restricted Observability Enhancement. %U http://dblp.uni-trier.de/db/journals/et/et35.html#KumarFS19 %V 35

@article{journals/et/KumarFS19, added-at = {2020-09-11T00:00:00.000+0200}, author = {Kumar, Binod and Fujita, Masahiro and Singh, Virendra}, biburl = {https://www.bibsonomy.org/bibtex/28a1ae9e4d0e59a3bf9a6fcb12c8a6910/dblp}, ee = {https://doi.org/10.1007/s10836-019-05830-y}, interhash = {8b89c311e890251b5b4d6a18e488e979}, intrahash = {8a1ae9e4d0e59a3bf9a6fcb12c8a6910}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 5, pages = {655-678}, timestamp = {2020-09-12T11:40:20.000+0200}, title = {SAT-based Silicon Debug of Electrical Errors under Restricted Observability Enhancement.}, url = {http://dblp.uni-trier.de/db/journals/et/et35.html#KumarFS19}, volume = 35, year = 2019 }