%0 Journal Article %1 journals/tvlsi/MrazekSDSS19 %A Mrazek, Vojtech %A Sekanina, Lukás %A Dobai, Roland %A Sýs, Marek %A Svenda, Petr %D 2019 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 12 %P 2734-2744 %T Efficient On-Chip Randomness Testing Utilizing Machine Learning Techniques. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi27.html#MrazekSDSS19 %V 27

@article{journals/tvlsi/MrazekSDSS19, added-at = {2020-03-11T00:00:00.000+0100}, author = {Mrazek, Vojtech and Sekanina, Lukás and Dobai, Roland and Sýs, Marek and Svenda, Petr}, biburl = {https://www.bibsonomy.org/bibtex/2930d6799f5cd92478e6051df96d84873/dblp}, ee = {https://doi.org/10.1109/TVLSI.2019.2923848}, interhash = {8c2b8d4ecbd86a5a74771327c623d6f3}, intrahash = {930d6799f5cd92478e6051df96d84873}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 12, pages = {2734-2744}, timestamp = {2020-03-12T11:44:49.000+0100}, title = {Efficient On-Chip Randomness Testing Utilizing Machine Learning Techniques.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi27.html#MrazekSDSS19}, volume = 27, year = 2019 }