%0 Conference Paper %1 conf/ats/NiitsuYIK12 %A Niitsu, Kiichi %A Yamaguchi, Takahiro J. %A Ishida, Masahiro %A Kobayashi, Haruo %B Asian Test Symposium %D 2012 %I IEEE Computer Society %K dblp %P 258-263 %T Post-Silicon Jitter Measurements. %U http://dblp.uni-trier.de/db/conf/ats/ats2012.html#NiitsuYIK12 %@ 978-1-4673-4555-2

@inproceedings{conf/ats/NiitsuYIK12, added-at = {2023-03-24T00:00:00.000+0100}, author = {Niitsu, Kiichi and Yamaguchi, Takahiro J. and Ishida, Masahiro and Kobayashi, Haruo}, biburl = {https://www.bibsonomy.org/bibtex/2fb16a9558e3a490df3bb1289cfcc2ce5/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2012}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2012.15}, interhash = {8c8d254a1e85c0de73e61d4e26525841}, intrahash = {fb16a9558e3a490df3bb1289cfcc2ce5}, isbn = {978-1-4673-4555-2}, keywords = {dblp}, pages = {258-263}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:33.000+0200}, title = {Post-Silicon Jitter Measurements.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2012.html#NiitsuYIK12}, year = 2012 }