%0 Conference Paper %1 conf/ats/XiangCSF03 %A Xiang, Dong %A Chen, Ming-Jing %A Sun, Jia-Guang %A Fujiwara, Hideo %B Asian Test Symposium %D 2003 %I IEEE Computer Society %K dblp %P 12-17 %T Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning. %U http://dblp.uni-trier.de/db/conf/ats/ats2003.html#XiangCSF03 %@ 0-7695-1951-2

@inproceedings{conf/ats/XiangCSF03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Xiang, Dong and Chen, Ming-Jing and Sun, Jia-Guang and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2645c28ad0faddfe68dbc53ed522ec454/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250774}, interhash = {8d2834af39e6cd247c39eddbe1686f5e}, intrahash = {645c28ad0faddfe68dbc53ed522ec454}, isbn = {0-7695-1951-2}, keywords = {dblp}, pages = {12-17}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:36.000+0200}, title = {Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2003.html#XiangCSF03}, year = 2003 }